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Failure Analysis
Failure Inspections & Evidence Inspections are frequently held on site at Micron's Independent Lab. (incl....
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SEM: Scanning Electron Microscopy
Scanning Electron Microscopy (SEM) aids in surface analysis by obtaining high-resolution, three-dimensional-like images...
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EDS: Energy Dispersive X-Ray Spectroscopy
Energy Dispersive X-Ray Spectroscopy (EDS) extends the usefulness of SEM in that elemental analysis & chemical...
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Auger Electron Spectroscopy
Auger Electron Spectroscopy (AES) is an analytical method for characterizing the surface (25-50 angstroms) chemistry of...
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Electon Spectroscopy for Chemical Analysis
Electron Spectroscopy for Chemical Analysis (ESCA), also referred to as X-Ray Photoelectron Spectroscopy (XPS), is an...
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Fourier Transform Infrared Spectroscopy
The FTIR System provides the highest performance available with a wide variety of sampling options. FTIR can identify...
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