Allied High Tech Products Incorporated
Products by Micron Inc.
  • Failure Analysis

    Failure Inspections & Evidence Inspections are frequently held on site at Micron's Independent Lab. (incl. electronics,metallography,fire investigation). On site sample preparation incl. sectioning, grinding, polishing, etching, filtering, ect. SEM, EDS, X-rays, Hardness, FTIR, Auger, DSC, TGA... Read More
  • SEM: Scanning Electron Microscopy

    Scanning Electron Microscopy (SEM) aids in surface analysis by obtaining high-resolution, three-dimensional-like images of solid samples. The resulting image depicts Variations of a material's surface topography in levels of grey. Details as small as 70 angstroms can be resolved on most... Read More
  • EDS: Energy Dispersive X-Ray Spectroscopy

    Energy Dispersive X-Ray Spectroscopy (EDS) extends the usefulness of SEM in that elemental analysis & chemical characterization can be performed within regions as small as a few cubic micrometers. All elements from boron through the periodic table can be detected with sensitivities of... Read More
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