12/2/21- Advanced Materials TLB

SEM: Scanning Electron Microscopy

Available from Micron Inc.

Scanning Electron Microscopy (SEM) aids in surface analysis by obtaining high-resolution, three-dimensional-like images of solid samples. The resulting image depicts Variations of a material's surface topography in levels of grey. Details as small as 70 angstroms can be resolved on most samples. Dynamic experiments can be documented with the aid of a conventional video recorder. Groups may view SEM testing on large viewing screen. Further testing for composition via FTIR or EDS on site. For More info Call: (302)998-1184 or email MicronAnalytical@compuserve.com

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