Failure Inspections & Evidence Inspections are frequently held on site at Micron's Independent Lab. (incl. electronics,metallography,fire investigation). On site sample preparation incl. sectioning, grinding, polishing, etching, filtering, ect. SEM, EDS, X-rays, Hardness, FTIR, Auger, DSC, TGA...
Scanning Electron Microscopy (SEM) aids in surface analysis by obtaining high-resolution, three-dimensional-like images of solid samples. The resulting image depicts Variations of a material's surface topography in levels of grey. Details as small as 70 angstroms can be resolved on most...
Energy Dispersive X-Ray Spectroscopy (EDS) extends the usefulness of SEM in that elemental analysis & chemical characterization can be performed within regions as small as a few cubic micrometers. All elements from boron through the periodic table can be detected with sensitivities of...
Auger Electron Spectroscopy (AES) is an analytical method for characterizing the surface (25-50 angstroms) chemistry of materials.
Range of Detectable Elements: All except Hydrogen and Helium
Detection Limits: Few atom percent
Area Sampled: Sub micrometer to several millimeters
Electron Spectroscopy for Chemical Analysis (ESCA), also referred to as X-Ray Photoelectron Spectroscopy (XPS), is an analytical method for characterizing the surface chemistry of materials.
Concentration Depth Profiles:
The ability to perform situ argon ion etching provides a means for...
The FTIR System provides the highest performance available with a wide variety of sampling options.
FTIR can identify functional groups, which can lead to identifying specific organic substances such as polymers, pharmaceuticals and more.
The Omnic software controls the data collection,...
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