Products by Asylum Research

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Scanning probe (STM, SOM, AFM, LFM, etc.)

Cypher AFM

The Cypher™ Atomic Force Microscope The World’s Fastest AND Highest Resolution AFM Asylum’s Cypher Atomic Force Microscope is the industry’s first new small sample AFM in over a decade, setting new standards for speed, resolution, stability, control, and modularity. Cypher provides low-drift...

Scanning probe (STM, SOM, AFM, LFM, etc.)

MFP-3D-BIO AFM

MFP-3D-BIO™ Atomic Force Microscope The Only Full-Capability AFM on an Inverted Optical Microscope The MFP-3D-BIO provides the highest sensitivity and most accurate images and measurements possible on an inverted optical platform. The NPS™ closed loop nanopositioning sensors on all three...

Scanning probe (STM, SOM, AFM, LFM, etc.)

MFP-3D-SA AFM

MFP-3D™ Stand Alone AFM The Widest Range of AFM/SPM Capabilities Available Today The Atomic Force Microscope (AFM), has been the instrument of choice for three dimensional measurements at the nanometer scale. With the MFP-3D Stand Alone (MFP-3D-SA) AFM, scientists can now choose a sensitive...

Scanning probe (STM, SOM, AFM, LFM, etc.)

MFP NanoIndenter

The MFP Instrumented NanoIndenter for Quantitative Materials Characterization Asylum’s MFP NanoIndenter is a true instrumented indenter and is the first AFM-based indenter that does not use cantilevers as part of the indenting mechanism. These characteristics and state-of-the-art AFM sensors...

Scanning probe (STM, SOM, AFM, LFM, etc.)

Ztherm Modulated Thermal Analysis for Asylum Research AFMs

Ztherm™ Modulated Thermal Analysis Option For Asylum Research AFMs Ztherm combines powerful conventional and new advanced thermal analysis capabilities with the high resolution of AFM, and adds patent pending compensation for thermally-induced cantilever bending and measurement of contact...

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