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MFP-3D™ Stand Alone AFM
The Widest Range of AFM/SPM Capabilities Available Today

The Atomic Force Microscope (AFM), has been the instrument of choice for three dimensional measurements at the nanometer scale. With the MFP-3D Stand Alone (MFP-3D-SA) AFM, scientists can now choose a sensitive and precise AFM with the lowest noise performance that also includes a complete scientific software environment. The MFP-3D-SA is ideal for many applications including physics, material science, polymers, chemistry, nanolithography, bioscience, and quantitative nanoscale measurements. The MFP-3D has the flexibility to acquire your data, analyze it, and even make publication-ready graphics. Your imagination is your only limit.

Technical Innovations

1. Sensored, closed loop positioning for high resolution imaging, accuracy, and reproducibility.

2. Pioneering all-digital controller for open software adaptability, power and flexibility.

3. Built-in advanced features such as real-time 3D rendering, nanolithography/nanomanipulation, and Dual AC™ Mode for dual resonance and harmonic imaging.

4. Designed for flexibility and expandability, with a wide range of available system, environmental and application options to enhance capabilities, including nanoindentation and Piezoresponse Force Microscopy (PFM). Please refer to the MFP-3D Options data sheet for details.

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