The MFP Instrumented NanoIndenter
for Quantitative Materials Characterization
Asylum’s MFP NanoIndenter is a true instrumented indenter and is the first AFM-based indenter that does not use cantilevers as part of the indenting mechanism. These characteristics and state-of-the-art AFM sensors provide substantial advantages in accuracy, precision and sensitivity over other nanoindenters.
Unlike cantilever indenters, the MFP NanoIndenter moves the indenting tip perpendicular to the surface. This vertical motion avoids the lateral movement and errors that are inherent in cantilever-based systems. Compared to conventional commercially-available instrumented nanoindenters, the MFP NanoIndenter provides lower detection limits and higher resolution measurements of force and indentation depth with the superior precision of AFM sensing technology.
The indenter is integrated with the AFM, providing the unique ability to quantify contact areas by performing AFM metrology of both the indenting tip and the resulting indentation. These direct measurements enable analysis of material properties with unprecedented accuracy relative to indirect calculation methods. The positioning accuracy in the sample plane is subnanometer using the MFP’s closed loop positioning sensors.
"After reviewing many instruments I chose the best AFM combined with the most elegant and simple-to-use nanoindentation tool." Matteo Chiesa, Masdar Institute of Science and Technology, Abu Dhabi