Scanning probe (STM, SOM, AFM, LFM, etc.)
Ztherm Modulated Thermal Analysis for Asylum Research AFMs
Ztherm™ Modulated Thermal Analysis Option For Asylum Research AFMs Ztherm combines powerful conventional and new advanced thermal analysis capabilities with the high resolution of AFM, and adds patent pending compensation for thermally-induced cantilever bending and measurement of contact... Read more »
