Product Details

Small-Spot X-ray Photoelectron Spectroscopy (XPS or ESCA) with Depth Profiling, Heating, & RGA MS
Scanning Auger Microprobe(SAM)
Infrared Spectroscopy (FTIR) with Golden Gate ATR for most materials and Veemax II variable-angle specular reflectance for enhanced surface sensitivity
Scanning Electron Microscopy (SEM) with Digital Imaging, Robinson Backscatter Electron Imaging, and Energy-Dispersive X-ray (EDX) spectroscopy
3D Imaging Surface Structure and Profilometry Analysis (Scanning White Light Interference Microscopy)
Metallographic Optical Microscopy
Thermal Anaylsis [Differential Scanning Calorimetry (DSC), Thermogravimetry (TG or TGA), and Thermomechanical Analysis (TMA) or dilatometry]
Electrochemical Evaluations (potentiostatic, galvanostatic, potentiodynamic polarization, and EIS) and Corrosion Testing
Coating and Film Thickness Measurements by profilometry, SEM, optical microscopy, XPS depth profile, eddy current, and magnetic probe meters
Cross Section Analysis
CO2 snow jet, Plasma (Microwave, Oxygen, or Hydrogen), UV, and Solvent Cleaning and Effectiveness Analysis
X-ray Diffraction (XRD)
Profilometry: Step Height Measurement and Surface Structure including Surface Roughness Measurements
Experimental Design
Expert Witness
Failure Analysis and Forensic Engineering
Quality Control and Assurance
Research and Development
Specimen Preparation

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