Equipment based on X-ray diffraction and hole-drilling are offered for measuring residual stresses and retained austenite contents.
X-ray stress analyzer (X-ray diffractometer) Xstress 3000 measures the stresses imposed on crystallite material by X-ray, based on the phenomenon known as Braggs Law. A standard Xstress 3000 X-ray stress analyzer (X-ray diffractometer) includes
goniometer G2/G2R or goniometer G3/G3R
Additionally Xstress 3000 can be equipped with
Floor stand for measuring large and complicated parts
Ring stand for measuring bearing rings
X-Y unit for easy stress measurements on the surface area of the part (mapping)
specially equipped table for electropolishing
X-ray elastic constant determination system for determining the Effective X-ray Elastic constant
Stresstech Group also offers Prism residual stress system, based on hole-drilling technique, for residual stress measurements. Prism dramatically increases the speed of data acquisition over the traditional strain gage hole-drilling technique of measuring residual stress.