Computer-Controlled Scanning Electron Microscopy

Available from RJ Lee Group, Inc.
Product Menu
View Company Profile View all Products

Product Details

CCSEM is an automated analytical technique that combines a scanning electron microscope (SEM), x-ray analyzer (EDS) and software-controlled digital scan to quickly locate, size and characterize large numbers of individual particles and group them based on their elemental composition and shape. A primary use for this technique is in the automated analysis of gun shot residue (GSR) particles. This technique can be customized based on the application needed.

Rate and Review RJ Lee Group, Inc. - Computer-Controlled Scanning Electron Microscopy

No reviews yet.

Let users know what you would have wanted to know about this company.