Computer-Controlled Scanning Electron Microscopy
Available from RJ Lee Group, Inc.
CCSEM is an automated analytical technique that combines a scanning electron microscope (SEM), x-ray analyzer (EDS) and software-controlled digital scan to quickly locate, size and characterize large numbers of individual particles and group them based on their elemental composition and shape. A primary use for this technique is in the automated analysis of gun shot residue (GSR) particles. This technique can be customized based on the application needed.