Scanning Electron Microscope (SEM) Services

Available from H&M Analytical Services
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H&M utilizes two different types of Scanning Electron Microscopes, both equipped with Energy Dispersive Spectrometers (EDS) for chemical analysis. A fully equipped state-of-the-art Field Emission SEM (FESEM) permits us to tackle the most challenging material problems while a conventional SEM permits us to offer a lower cost alternative for more routine work.

Among the many features are:

• Backscattered and Secondary imaging
• Elemental mapping
• Semi-quantitative chemical analysis
• In-lens SE detection for true surface imaging
• Low voltage operation for beam sensitive materials
• Large samples up to 250 mm diameter & 145 mm tall
• 1.3 nm resolution @ 20kV
• Digital imaging (3072 x 2304 pixels)

The SEM is an ideal tool for a wide range of applications:

• Nanostructures
• Device or component failure analysis
• Particle size, distribution and morphology
• Corrosion products
• Minerals & ores
• Fracture analysis
• Forensic

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