Release Date: Thursday, December 11, 2014
MAHWAH, NJ, December 11, 2014 – EDAX, Inc., a leader in X-ray microanalysis and electron diffraction instrumentation, has introduced the Element Silicon Drift Detector (SDD), a new product line focused on serving the needs of the industrial market segment.
The Element SDD delivers powerful analytical capability in a compact package, maximizing performance and flexibility, while providing streamlined operation to guarantee fast results and ease of use. It offers excellent resolution and market-leading throughput, and is designed with a silicon nitride (Si 3 N 4 ) window to optimize low energy X-ray transmission for light element analysis. Backed by application-specific software, Element provides fast and efficient results for industrial analysis needs.
The Element SDD’s advanced design allows for a small footprint, which opens up opportunities in the growing tabletop and compact scanning electron microscope market. It saves space for additional analytical equipment and allows flexibility to ensure the ideal geometry and best data collection conditions.
EDAX’s proven electronics enable detector performance to remain best in class over the entire range of count rates, allowing users to pick the ideal electron beam conditions for their samples without worrying about degrading SDD performance.
“Element is the perfect complement to our Octane family of SDDs”, notes Mike Coy, Director of Product Marketing. “While our Octane SDD family is the ultimate characterization tool for the research and development world, Element is a solutions-based product that excels at basic analysis. It provides applications specific software and analysis that can quickly provide answers in the industrial environment.
“Industrial needs often call for a pass/fail or other quick answer response to keep a production line moving. Although more in-depth analysis is not as important in that mode, Element can provide the superior analytical performance that EDAX users have come to expect,” notes Coy.
“Excellent resolution and resolution stability ensure that high-quality data can be collected on all types of samples and under all microscope conditions,” he adds.
The Element SDD is based on a 25 mm 2 chip and has a Si 3 N 4 window to improve performance for light elements and low energies. Additionally, its advanced, low-noise electronics provide outstanding throughputs to turn input counts into results. Element SDDs can be installed on both scanning and transmission electron microscopes (SEM and TEM).
Element will offer application specific software with a highly functional user interface with modules, such as Particle Analysis, Spectrum Match, Gun Shot Residue and others, available as building blocks on the main GUI.
“Element is all about getting results, as quickly and accurately as possible. Fast answers mean less down time, faster time to market, and a higher return on investment,” concludes Coy
EDAX is the acknowledged leader in Energy Dispersive Microanalysis, Electron Backscatter Diffraction and X-ray Fluorescence instrumentation. EDAX designs, manufactures, installs and services high-quality products and systems for leading companies in the semiconductor, metals, geological, pharmaceutical, biomaterials, and ceramics markets.
Since 1962, EDAX has used its knowledge and experience to develop ultra-sensitive silicon radiation sensors, digital electronics and specialized application software that facilitate solutions to research, development and industrial requirements.
EDAX is a unit of AMETEK Materials Analysis Division. AMETEK, Inc. is a leading global manufacturer of electronic instruments and electromechanical devices with annualized sales of $4.2 billion.
For additional information about EDAX, contact:
91 McKee Drive, Mahwah, NJ 07430
Tel: (201) 529-4880 • Fax: (201) 529-3156
E-mail: [email protected]
Click here for a hi-res image of the EDAX Element Silicon Drift Detector