MAHWAH, NJ, USA – Building on the success of its original Octane Silicon Drift Detector (SDD) Series for the TEAM™ EDS Analysis System, EDAX Inc., a leader in X-ray microanalysis and electron diffraction instrumentation, has announced the addition of a new series of Octane Elite SDDs to its existing portfolio of detectors. EDAX will introduce the new SDDs at the upcoming Microscopy and Microanalysis 2015 Conference, August 3 to 6, 2015 in Portland, OR (Booth #445).
The Octane Elite SDD Series offers an up to 35% improvement in light element sensitivity and outstanding low-energy performance due to the use of silicon nitride (Si 3 N 4 ) entry windows, which replace the polymer windows that have been standard since the inception of SDD technology.
The material properties and durability of silicon nitride enable the use of a detector window that is under 100 nm thick and therefore offers increased transmission and hence more critical data for materials analysis. In addition to durability, Si 3 N 4 is known for thermal, corrosion and shock resistance. It is chemically inert, except to certain strong acids in the presence of humidity and temperatures above 140˚C. Neither of which is likely to ever be encountered inside a scanning electron microscope.
While the durability of the window material is an advantage because it allows for the use of more robust and reliable detectors, the true benefits of Si 3 N 4 for EDS applications lie elsewhere. The material enables the detector’s windows to be more thinly fabricated, which offers tremendous superiority in terms of sensitivity to X-rays as required for optimal low-voltage analysis. Along with that, the mechanical properties of Si 3 N 4 permit a reduction in the area of the necessary support grid, compared with a polymer window, offering further efficiencies throughout the X-ray energy range and resulting in additional increases in real-world throughput and data collection.
The Octane Elite Series also uses widely praised CUBE technology, which yields high-speed X-ray data processing within a smaller detector device. The impermeable silicon nitride window permits fully tight vacuum encapsulation of the detector module. This allows the detector to operate at colder temperatures, which increases the resolution performance, especially at maximum speeds. The new detectors also offer a standard motorized slide.
“The improvements in low-voltage performance of the Octane Elite detectors are of special interest to the world of materials characterization because decreased accelerating voltage leads to smaller interaction volumes and allows analysis of smaller features and thinner films in today’s nano-world,” comments Frank Cumbo, Global Sales and Marketing Manager at EDAX.
“At EDAX we develop analytical tools that can evolve to meet changing market requirements. The new Octane Elite detectors put EDAX customers on the cutting edge of microanalysis allowing them to solve their most difficult microanalysis challenges.”
EDAX is an acknowledged leader in Energy Dispersive Microanalysis, Electron Backscatter Diffractions and X-ray Fluorescence Instrumentation. EDAX designs, manufactures, installs and services high-quality products and systems for leading companies in the semiconductor, metals, geological, pharmaceutical, biomaterials, and ceramics markets.
Since 1962, EDAX has used its knowledge and experience to develop ultra-sensitive silicon radiation sensors, digital electronics and specialized applications software that facilitate solutions to research, development and industrial requirements.
EDAX is a unit of the Materials Analysis Division of AMETEK, Inc., which is a leading global manufacturer of electronic instruments and electromechanical devices with annual sales of $4.0 billion.
For further information about EDAX, contact: