EDAX offers different silicon drift detectors (SDDs) to meet your specific analysis needs.
The Element Detector is focused on serving the needs of the industrial and entry level market segments. It delivers powerful analytical capability in a complex package. It offers excellent resolution and market-leading throughput with a silicon nitride window to optimize low energy X-ray transmission for light element analysis. Its application specific, easy-to-use software provides fast and efficient results for industrial analysis needs.
The Octane Elite SDD Series takes detector technology to the next level. It also makes use of the silicon nitride window and pairs it with the widely praised CUBE technology, which yields high speed X-ray data processing within a smaller and fully vacuum encapsulated detector device. The silicon nitride window offers 35% more transmissivity compared to a polymer window, leading to greatly improved light element performance and significantly more critical data for the materials analyst. The CUBE technology allows the detector to operate at lower temperatures using less power, which results in better resolution. The Octane Elite SDD Series provides the fastest pulse processing available and can produce high-resolution quantitative analysis at mapping speeds up to 200,000 cps.